%0 Conference Paper
%K Thin films
%K Crystal structure
%K Ferroelectric materials
%K Dielectric materials
%K Permittivity
%K Magnetic domains
%K 180° c-c domain wall
%K 90° a-c domain wall
%K Linear dielectric constant
%K Nonlinear dielectric constant
%K PZT thin films
%K Scanning nonlinear dielectric microscopy
%A Y Cho
%A K Matsuura
%A N Valanoor
%A Ramamoorthy Ramesh
%B Ferroelectrics
%D 2003
%G eng
%P 171-180
%R 10.1080/00150190390222961
%S Ferroelectrics
%T Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy
%V 292