%0 Journal Article
%K Substrates
%K Ferroelectricity
%K Single crystals
%K Ferroelectric films
%K Ferroelectric switching
%K Ferroelastic domains
%K Bottom electrodes
%K Epitaxial films
%K Unit cells
%K Semiconducting bismuth compounds
%K X-ray diffractions
%K Growth (materials)
%K Semiconducting silicon compounds
%K X-ray diffraction analysis
%K Atomic-force microscopies
%K Device applications
%K Domain engineerings
%K Ferroelectric properties
%K High qualities
%K High resolutions
%K HRXRD
%K Reciprocal space mappings
%K Si substrates
%K Step-flow growths
%K Stripe domains
%K Substrate anisotropies
%K Variant selections
%A H.W Jang
%A D Ortiz
%A S.-H Baek
%A C.M Folkman
%A R.R Das
%A P Shafer
%A Yimin Chen
%A C.T Nelson
%A X Pan
%A Ramamoorthy Ramesh
%A C.-B Eom
%B Advanced Materials
%D 2009
%G eng
%P 817-823
%R 10.1002/adma.200800823
%T Domain engineering for enhanced ferroelectric properties of epitaxial (001) BiFeO thin films
%V 21