%0 Journal Article
%K Electric fields
%K Electric-field control
%K Random access storage
%K Controlled nanocrack
%K Nano-electromechanical
%K Nanoelectromechanical switches
%K Non-volatile memory
%K Non-volatile random access memory
%K Off-state leakage current
%K ON/OFF current ratio
%K Electric switches
%A Q Luo
%A Z Guo
%A H Huang
%A Q Zou
%A X Jiang
%A S Zhang
%A H Wang
%A M Song
%A B Zhang
%A H Chen
%A H Gu
%A G Han
%A X Yang
%A X Zou
%A K.-Y Wang
%A Z Liu
%A J Hong
%A Ramamoorthy Ramesh
%A L You
%B IEEE Electron Device Letters
%D 2019
%G eng
%I Institute of Electrical and Electronics Engineers Inc.
%P 1209-1212
%R 10.1109/LED.2019.2917924
%T Nanoelectromechanical switches by controlled switchable cracking
%V 40