%0 Journal Article
%K deposition
%K temperature
%K measurements
%K measurement
%K surface
%K thin films
%K pulsed laser deposition
%K x-ray diffraction
%K film
%K films
%K thin
%K thin film
%K thin-film
%K thin-films
%K ablation
%K laser
%K superconducting
%K diffraction
%K layers
%K oriented
%K resistance
%K state
%K time
%K x-ray
%K x-ray-diffraction
%K dependence
%K alloy
%K cuo
%K phase
%K pulsed laser
%K pulsed-laser
%K metallic
%K substrate
%K substrates
%K layer
%K deposited
%K intermediate
%K k
%K l
%K laser deposition
%K phases
%K polycrystalline
%K pulsed-laser-deposition
%K superconducting thin film
%K superconducting thin films
%K superconducting thin-films
%K superconducting transition
%K transition
%K ysz
%K yttria stabilized zirconia
%K yttria-stabilized zirconia
%K yttria-stabilized-zirconia
%K zero resistance
%K zirconia
%K zirconium
%A Xianglei Mao
%A Paul H Berdahl
%A Richard E Russo
%A H B Liu
%A James C Ho
%B Physica C: Superconductivity
%D 1991
%F Laser
%G eng
%N 1-3
%P 167-171
%R 10.1016/0921-4534(91)90781-S
%T Bi-Pb-Sb-Sr-Ca-Cu-O Superconducting Thin-Films Deposited on Ni-Based Alloy with Yttria-Stabilized Zirconia Intermediate Layers
%V 183
%2 LBNL-31395
%8 11/1991
%X <p>Bi-Pb-Sb-Sr-Ca-Cu-O superconducting thin films were grown as deposited using pulsed laser deposition on polycrystalline metallic alloy substrates with yttria-stabilized zirconia (YSZ) intermediate layers. YSZ intermediate layers have (111) direction perpendicular to alloy surface as determined by X-ray diffraction measurements. X-ray diffraction data show that the Bi-Pb-Sb-Sr-Ca-Cu-O films are <em>c</em>-axis oriented and contain primarily the 2212 phase with minor 2201 and CuO phases. Following an onset of superconducting transition above 90 K, the reproducible zero resistance temperature of these films is 62 K with J<sub>c</sub> of approximately 620 A/cm<sup>2</sup> at 30 K</p>