%0 Journal Article
%K deposition
%K temperature
%K measurements
%K measurement
%K usa
%K surface
%K ablation
%K laser
%K laser ablation
%K laser-ablation
%K vaporization
%K oxide
%K time
%K beam
%K ca
%K e
%K element
%K fractionation
%K glass
%K glasses
%K icp-ms
%K inductively coupled plasma
%K inductively coupled plasma mass spectrometry
%K inductively-coupled-plasma
%K mass
%K mass spectrometer
%K mass spectrometry
%K mass-spectrometer
%K mass-spectrometry
%K plasma
%K plasma mass spectrometry
%K plasma-mass-spectrometry
%K sample
%K sampling
%K spectrometer
%K spectrometry
%K lasers
%K ratio
%K single
%K crater
%K lam-icp-ms
%K nd:yag
%K elements
%K ratios
%K 266 nm
%K nd:yag laser
%K nm
%K correlation
%K laser ablation sampling
%K laser beam
%K melting
%K 213 nm
%K nist
%K wavelength
%K crater geometry
%K depth
%K microanalysis
%K nd
%K wavelengths
%K yag
%K glass samples
%K elemental fractionation
%K geochronology
%K irradiance
%K laser wavelength
%K laser-wavelength
%K pb/u
%K temperatures
%K zircon
%A Haichen Liu
%A Oleg V Borisov
%A Xianglei Mao
%A Stephen Shuttleworth
%A Richard E Russo
%B Applied Spectroscopy
%D 2000
%F Laser
%G eng
%N 10
%P 1435-1442
%T Pb/U fractionation during Nd : YAG 213 nm and 266 nm laser ablation sampling with inductively coupled plasma mass spectrometry
%V 54
%2 LBNL-46626
%8 10/2000
%X <p>Elemental fractionation during laser ablation sampling was investigated by measuring Pb/U ratios in NIST 610 synthetic glass. Two Nd:YAG lasers with wavelengths of 213 and 266 nm were used to ablate the sample into an inductively coupled plasma mass spectrometer. Pb/U fractionation was observed to be similar for both laser wavelengths, and dependent on the irradiance. For representative Pb/U measurements, the necessary laser irradiance should be &gt;0.6 GW/cm<sup>2</sup>. However, if the laser beam is initially focused close to the sample surface, fractionation increases and is influenced by the formation of a crater during repetitive pulsing at a single sample location. As the ratio of crater depth to radius increases, plasma sampling and/or an effective irradiance decrease could cause additional fractionation. A good correlation was found between the fractionation of 14 elements in NIST 610 glass and the logarithms of their oxide melting temperatures.</p>