%0 Journal Article
%K measurements
%K measurement
%K orientation
%K copper
%K x-ray diffraction
%K film
%K thin-films
%K a-axis
%K anisotropy
%K bulk
%K conductors
%K copper oxide
%K critical-field
%K crystallites
%K determination
%K diffraction
%K field
%K fields
%K high-tc
%K layers
%K magnetic field
%K magnetic-field
%K magnetoresistance
%K microscopy
%K o superconducting films
%K oriented
%K oxide
%K p
%K plane
%K resistance
%K resistivity
%K state
%K superconductor
%K texture
%K time
%K x-ray
%K x-ray-diffraction
%K yba2cu3ox
%A Paul H Berdahl
%A Xianglei Mao
%A Ronald P Reade
%A Michael D Rubin
%A Richard E Russo
%A E Yin
%B Physica C
%D 1992
%F Laser
%G eng
%M 28
%P 93-102
%T Angular Magnetoresistance Provides Texture Information on High-Tc Conductors
%V 195
%2 LBNL-31513
%X <p>Angular magnetoresistance measurements are performed by rotating a superconductor to an angle-theta in a fixed magnetic field, while monitoring the resistance R. It is argued theoretically that for fields well above the lower critical field, H much greater than H(cl), the bulk resistivity of the conductor is independent of theta if the crystallites of which it is composed are randomly oriented. Non-random orientation (a key aspect of texture) is revealed, therefore, by variations of R with theta. Dips in R indicate that the field is parallel to the copper oxide planes in a significant fraction of the current-carrying crystallites. C-axis, a-axis, and other textured film conductors are used to illustrate the technique. The angular magnetoresistance is found to be an important supplement to conventional texture determinations by microscopy and X-ray diffraction</p>