%0 Journal Article
%K Measurements
%K Measurement
%K Orientation
%K Copper
%K X-ray Diffraction
%K Film
%K Thin films
%K A-axis
%K Anisotropy
%K Bulk
%K Conductors
%K Copper oxide
%K Critical-field
%K Crystallites
%K Determination
%K Diffraction
%K Field
%K Fields
%K High-tc
%K Layers
%K Magnetic field
%K Magnetic field
%K Magnetoresistance
%K Microscopy
%K O superconducting films
%K Oriented
%K Oxide
%K P
%K Plane
%K Resistance
%K Resistivity
%K State
%K Superconductor
%K Texture
%K Time
%K X-Ray
%K X-ray Diffraction
%K Yba2cu3ox
%A Paul H Berdahl
%A Xianglei Mao
%A Ronald P Reade
%A Michael D Rubin
%A Richard E Russo
%A E Yin
%B Physica C
%D 1992
%F Laser
%G eng
%M 28
%P 93-102
%T Angular Magnetoresistance Provides Texture Information on High-Tc Conductors
%V 195
%2 LBNL-31513
%X <p>Angular magnetoresistance measurements are performed by rotating a superconductor to an angle-theta in a fixed magnetic field, while monitoring the resistance R. It is argued theoretically that for fields well above the lower critical field, H much greater than H(cl), the bulk resistivity of the conductor is independent of theta if the crystallites of which it is composed are randomly oriented. Non-random orientation (a key aspect of texture) is revealed, therefore, by variations of R with theta. Dips in R indicate that the field is parallel to the copper oxide planes in a significant fraction of the current-carrying crystallites. C-axis, a-axis, and other textured film conductors are used to illustrate the technique. The angular magnetoresistance is found to be an important supplement to conventional texture determinations by microscopy and X-ray diffraction</p>