TY - JOUR AU - Stephen Taller AU - David Woodley AU - Elizabeth Getto AU - Anthony M Monterrosa AU - Zhijie Jiao AU - Ovidiu Toader AU - Fabian Naab AU - Thomas Kubley AU - Shyam Dwaraknath AU - Gary S Was AB -

The effects of transmutation produced helium and hydrogen must be included in ion irradiation experiments to emulate the microstructure of reactor irradiated materials. Descriptions of the criteria and systems necessary for multiple ion beam irradiation are presented and validated experimentally. A calculation methodology was developed to quantify the spatial distribution, implantation depth and amount of energy-degraded and implanted light ions when using a thin foil rotating energy degrader during multi-ion beam irradiation. A dual ion implantation using 1.34 MeV Fe+ ions and energy-degraded D+ ions was conducted on single crystal silicon to benchmark the dosimetry used for multi-ion beam irradiations. Secondary Ion Mass Spectroscopy (SIMS) analysis showed good agreement with calculations of the peak implantation depth and the total amount of iron and deuterium implanted. The results establish the capability to quantify the ion fluence from both heavy ion beams and energy-degraded light ion beams for the purpose of using multi-ion beam irradiations to emulate reactor irradiated microstructures.

BT - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms DA - 12/2017 DO - 10.1016/j.nimb.2017.08.035 LA - eng N2 -

The effects of transmutation produced helium and hydrogen must be included in ion irradiation experiments to emulate the microstructure of reactor irradiated materials. Descriptions of the criteria and systems necessary for multiple ion beam irradiation are presented and validated experimentally. A calculation methodology was developed to quantify the spatial distribution, implantation depth and amount of energy-degraded and implanted light ions when using a thin foil rotating energy degrader during multi-ion beam irradiation. A dual ion implantation using 1.34 MeV Fe+ ions and energy-degraded D+ ions was conducted on single crystal silicon to benchmark the dosimetry used for multi-ion beam irradiations. Secondary Ion Mass Spectroscopy (SIMS) analysis showed good agreement with calculations of the peak implantation depth and the total amount of iron and deuterium implanted. The results establish the capability to quantify the ion fluence from both heavy ion beams and energy-degraded light ion beams for the purpose of using multi-ion beam irradiations to emulate reactor irradiated microstructures.

PY - 2017 SP - 1 EP - 10 ST - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms T2 - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms TI - Multiple ion beam irradiation for the study of radiation damage in materials VL - 412 SN - 0168583X ER -