TY - JOUR
AU - D.M Hwang
AU - Ramamoorthy Ramesh
AU - C.Y Chen
AU - X.D Wu
AU - A Inam
AU - M.S Hegde
AU - B Wilkens
AU - C.C Chang
AU - L Nazar
AU - T Venkatesan
AU - S Miura
AU - S Matsubara
AU - Y Miyasaka
AU - N Shohata
AB - In situ superconducting YBa2Cu3O7-x films with Tc0 up to 87 K and Jc, 77 K up to 6×10 4 A/cm2 were prepared on Si substrates with MgAl 2O4 and BaTiO3 double-buffer layers. The epitaxial relations between various layers were established by transmission electron microscopy. The MgAl2O4 layer is heavily faulted. The subsequent BaTiO3 layer stops most of the faults, provides a template for the YBa2Cu3O7-x growth, and partially screens off the stress due to different thermal expansion coefficients. The microstructure of the YBa2Cu3O 7-x layer is very similar to that of the films deposited directly on SrTiO3, exhibiting a homogeneous heavily faulted single-crystal-like structure free from secondary phases and grain boundaries. The slight degradation of the transport properties is attributed to residual thermal stress.
BT - Journal of Applied Physics
DO - 10.1063/1.346607
LA - eng
M1 - 4
N1 - cited By 16
N2 - In situ superconducting YBa2Cu3O7-x films with Tc0 up to 87 K and Jc, 77 K up to 6×10 4 A/cm2 were prepared on Si substrates with MgAl 2O4 and BaTiO3 double-buffer layers. The epitaxial relations between various layers were established by transmission electron microscopy. The MgAl2O4 layer is heavily faulted. The subsequent BaTiO3 layer stops most of the faults, provides a template for the YBa2Cu3O7-x growth, and partially screens off the stress due to different thermal expansion coefficients. The microstructure of the YBa2Cu3O 7-x layer is very similar to that of the films deposited directly on SrTiO3, exhibiting a homogeneous heavily faulted single-crystal-like structure free from secondary phases and grain boundaries. The slight degradation of the transport properties is attributed to residual thermal stress.
PY - 1990
SP - 1772
EP - 1776
T2 - Journal of Applied Physics
TI - Epitaxial relations between in situ superconducting YBa2Cu 3O7-x thin films and BaTiO3/MgAl 2O4/Si substrates
VL - 68
SN - 00218979
ER -