TY - JOUR
AU - J.B Barner
AU - C.T Rogers
AU - A Inam
AU - Ramamoorthy Ramesh
AU - S Bersey
AB - We have demonstrated the controllable, reproducible fabrication of nonhysteretic Josephson devices with excess-current weak-link characteristics at temperatures up to 80 K. The devices are patterned from in situ deposited a-axis oriented YBa2Cu3O7-y-PrBa 2Cu3O7-z-YBa2Cu3O 7-y trilayers grown on SrTiO3(001) substrates. Control of the critical current density and resistance is achieved by varying the thickness of the PrBa2Cu3O7-z barrier layer. Critical current densities in excess of 104 A/cm2 have been reproducibly measured; good uniformity across the wafer is obtained with device parameters scaling with device area. Strong constant-voltage current steps are observed under 11.2 GHz microwave radiation at temperatures up to and above 80 K.
BT - Applied Physics Letters
DO - 10.1063/1.105330
LA - eng
M1 - 6
N1 - cited By 150
N2 - We have demonstrated the controllable, reproducible fabrication of nonhysteretic Josephson devices with excess-current weak-link characteristics at temperatures up to 80 K. The devices are patterned from in situ deposited a-axis oriented YBa2Cu3O7-y-PrBa 2Cu3O7-z-YBa2Cu3O 7-y trilayers grown on SrTiO3(001) substrates. Control of the critical current density and resistance is achieved by varying the thickness of the PrBa2Cu3O7-z barrier layer. Critical current densities in excess of 104 A/cm2 have been reproducibly measured; good uniformity across the wafer is obtained with device parameters scaling with device area. Strong constant-voltage current steps are observed under 11.2 GHz microwave radiation at temperatures up to and above 80 K.
PY - 1991
SP - 742
EP - 744
T2 - Applied Physics Letters
TI - All a-axis oriented YBa2Cu3O7-y-PrBa 2Cu3O7-z-YBa2Cu3O 7-y Josephson devices operating at 80 K
VL - 59
SN - 00036951
ER -