TY - CPAPER
KW - Thin films
KW - Transmission electron microscopy
KW - Lanthanum compounds
KW - Ferroelectric materials
KW - Epitaxial growth
KW - Bismuth compounds
KW - High resolution transmission electron microscopy
KW - Lead compounds
KW - Ferroelectric thin films
KW - Crystal defects
KW - Phase interfaces
KW - Semiconducting silicon compounds
KW - Crystals
KW - Semiconducting films
KW - Crystal microstructure
AU - S.G Ghonge
AU - E Goo
AU - Ramamoorthy Ramesh
AU - R Haakenaasen
AU - D.K Fork
AU - Garratt-Reed G.W
AB - Microstructure of epitaxial ferroelectric/conductive oxide heterostructures on LaAlO3 (LAO) and Si substrates have been studied by conventional and high resolution transmission electron microscopy. The epitaxial films have a wide range of potential applications in areas such as non-volatile memory devices, electro-optic devices and pyroelectric detectors.
BT - Proceedings of the - Annual Meeting, Microscopy Society of America
LA - eng
N1 - cited By 0
N2 - Microstructure of epitaxial ferroelectric/conductive oxide heterostructures on LaAlO3 (LAO) and Si substrates have been studied by conventional and high resolution transmission electron microscopy. The epitaxial films have a wide range of potential applications in areas such as non-volatile memory devices, electro-optic devices and pyroelectric detectors.
PY - 1994
SP - 572
EP - 573
T2 - Proceedings of the - Annual Meeting, Microscopy Society of America
T3 - - Annual Meeting, Microscopy Society of America
TI - Epitaxial ferroelectric thin films
ER -