TY - CPAPER
KW - Thin films
KW - Nanostructured materials
KW - Atomic force microscopy
KW - Polarization
KW - Ferroelectric materials
KW - Magnetic domains
KW - Grain boundaries
KW - Scanning force microscopy (SFM)
AU - A Gruverman
AU - S.A Prakash
AU - S Aggarwal
AU - Ramamoorthy Ramesh
AU - O Auciello
AU - H Tokumoto
AB - Scanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.
BT - Proceedings of the Materials Research Society Symposium -
LA - eng
N1 - cited By 5
N2 - Scanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.
PB - MRS, Warrendale, PA, United States
PY - 1998
SP - 53
EP - 58
T2 - Proceedings of the Materials Research Society Symposium -
T3 - Materials Research Society Symposium -
TI - Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy
VL - 493
SN - 02729172
ER -