TY - CPAPER
KW - Thin films
KW - Transmission electron microscopy
KW - Laser ablation
KW - Pulsed laser ablation (PLA)
KW - Surface roughness
KW - X-ray Diffraction
KW - Electric field effects
KW - Semiconducting lead compounds
KW - Polycrystalline materials
KW - Magnesia
KW - Amplitude modulation
KW - Electrooptical materials
KW - Light modulators
KW - Semiconducting gallium arsenide
KW - Optical amplitude
AU - D Young
AU - H Li
AU - S Choopun
AU - L Wang
AU - L Salamanca-Riba
AU - Ramamoorthy Ramesh
AU - A Christou
AB - Electro-Optic Pb0.9tLa0.09Zr0.65Ti 0.35O3 (PLZT) thin films are studied for transverse optical modulator applications. PLZT thin films were grown by pulsed laser ablation on MgO and GaAs substrates. Structural characterization by x-ray diffraction, transmission electron microscopy, Rutherford backscattering, and sputter Auger electron profiling indicate polycrystalline, phase pure PLZT with evidence of interdiffusion and approximately 20nm RMS surface roughness. Single PLZT thin films, grown on MgO substrates with a SrTiO3 (STO) buffer layer, were fabricated into simple modulator structures for electro-optical characterization. Measurements were performed in normal transmission mode. Application of an oscillating electric field across the PLZT layer produced optical amplitude and phase modulation. The application of an oscillating electric field of frequency f across the PLZT has been observed to produce f and 2f frequency modulation in both the phase and amplitude of the output light. Theoretical considerations show that this can be attributed to the quadratic nature of the electro-optic effect in PLZT. ©1999 Materials Research Society.
BT - Proceedings of the Materials Research Society Symposium -
LA - eng
N1 - cited By 0
N2 - Electro-Optic Pb0.9tLa0.09Zr0.65Ti 0.35O3 (PLZT) thin films are studied for transverse optical modulator applications. PLZT thin films were grown by pulsed laser ablation on MgO and GaAs substrates. Structural characterization by x-ray diffraction, transmission electron microscopy, Rutherford backscattering, and sputter Auger electron profiling indicate polycrystalline, phase pure PLZT with evidence of interdiffusion and approximately 20nm RMS surface roughness. Single PLZT thin films, grown on MgO substrates with a SrTiO3 (STO) buffer layer, were fabricated into simple modulator structures for electro-optical characterization. Measurements were performed in normal transmission mode. Application of an oscillating electric field across the PLZT layer produced optical amplitude and phase modulation. The application of an oscillating electric field of frequency f across the PLZT has been observed to produce f and 2f frequency modulation in both the phase and amplitude of the output light. Theoretical considerations show that this can be attributed to the quadratic nature of the electro-optic effect in PLZT. ©1999 Materials Research Society.
PY - 1999
SP - 753
EP - 757
T2 - Proceedings of the Materials Research Society Symposium -
T3 - Materials Research Society Symposium -
TI - Optical phase and amplitude modulation in (9/65/35) Pb-La-Zr-Ti-O thin films
VL - 541
SN - 02729172
ER -