TY - CPAPER
KW - Transmission electron microscopy
KW - Lattice constants
KW - Electrodes
KW - Substrates
KW - Crystal structure
KW - Lanthanum compounds
KW - Epitaxial growth
KW - Calculations
KW - X-ray Diffraction
KW - Lead compounds
KW - Strain
KW - Thick films
KW - C domain fractions
KW - Electrode layer
KW - Inplane strains
KW - Polydomain structure
AU - S.P Alpay
AU - V Nagarajan
AU - L.A Bendersky
AU - M.D Vaudin
AU - S Aggarwal
AU - Ramamoorthy Ramesh
AU - A.L Roytburd
AB - The domain structure of the 400 nm thick PbZr0.2Ti0.8O3 (PZT) films with different electrode layer configurations was investigated by x-ray diffraction and transmission electron microscopy. The c-domain fractions of the PZT films with no electrode layer, with a 50 nm electrode layer between the film and the substrate, and with 50 nm electrode layers on top and bottom of the PZT film were found to be equal. This means that depolarizing fields do not affect the polydomain structure of the film. Calculations of the in-plane strains based on the lattice parameters of the La0.5Sr0.5CoO3 (LSCO) layer in the above configurations led to the conclusion that the bottom electrode layer is coherently strained to match the substrate. © 1999 Materials Research Society.
BT - Proceedings of the Materials Research Society Symposium -
LA - eng
N1 - cited By 0
N2 - The domain structure of the 400 nm thick PbZr0.2Ti0.8O3 (PZT) films with different electrode layer configurations was investigated by x-ray diffraction and transmission electron microscopy. The c-domain fractions of the PZT films with no electrode layer, with a 50 nm electrode layer between the film and the substrate, and with 50 nm electrode layers on top and bottom of the PZT film were found to be equal. This means that depolarizing fields do not affect the polydomain structure of the film. Calculations of the in-plane strains based on the lattice parameters of the La0.5Sr0.5CoO3 (LSCO) layer in the above configurations led to the conclusion that the bottom electrode layer is coherently strained to match the substrate. © 1999 Materials Research Society.
PY - 1999
SP - 357
EP - 362
T2 - Proceedings of the Materials Research Society Symposium -
T3 - Materials Research Society Symposium -
TI - The stress state and domain structure of epitaxial PbZr0.2Ti0.8O3 films on (001) SrTiO3 with and without la0.5r0.5CoO3 electrode layer
VL - 541
SN - 02729172
ER -