TY - JOUR
KW - Single crystals
KW - Ferroelectric thin films
KW - Microscopic examination
KW - Light polarization
KW - Laser pulses
KW - Second harmonic generation
KW - Optical fibers
KW - Second-harmonic imaging
KW - Optical resolving power
AU - I.I Smolyaninov
AU - H.Y Liang
AU - C.H Lee
AU - C.C Davis
AU - S Aggarwal
AU - Ramamoorthy Ramesh
AB - We present a near-field optical technique for second-harmonic imaging by use of tapered optical fiber tips externally illuminated with femtosecond laser pulses. Enhancement of the electric field at the tip of the fiber results in enhanced second-harmonic (SH) generation from the sample region near the tip. This SH emission is collected by the same tapered fiber. The spatial distribution and polarization properties of SH generation from thin ferroelectric films and a poled single crystal of BaTiO3 have been studied. A spatial resolution of the order of 80 nm was achieved. Symmetry properties of the near-field SH signal allow us to recover the local poling direction of individual ferroelectric domains in the film. Thus the technique provides a novel tool for nanometer-scale crystal analysis of polycrystalline samples. © 2000 Optical Society of America.
BT - Optics Letters
DO - 10.1364/OL.25.000835
LA - eng
M1 - 11
N1 - cited By 15
N2 - We present a near-field optical technique for second-harmonic imaging by use of tapered optical fiber tips externally illuminated with femtosecond laser pulses. Enhancement of the electric field at the tip of the fiber results in enhanced second-harmonic (SH) generation from the sample region near the tip. This SH emission is collected by the same tapered fiber. The spatial distribution and polarization properties of SH generation from thin ferroelectric films and a poled single crystal of BaTiO3 have been studied. A spatial resolution of the order of 80 nm was achieved. Symmetry properties of the near-field SH signal allow us to recover the local poling direction of individual ferroelectric domains in the film. Thus the technique provides a novel tool for nanometer-scale crystal analysis of polycrystalline samples. © 2000 Optical Society of America.
PB - Optical Society of America (OSA)
PY - 2000
SP - 835
EP - 837
T2 - Optics Letters
TI - Near-field second-harmonic microscopy of thin ferroelectric films
VL - 25
SN - 01469592
ER -