TY - CPAPER
KW - Pulsed laser deposition
KW - Electrochemical electrodes
KW - Surface structure
KW - Substrates
KW - Ferroelectric materials
KW - Permittivity
KW - Thin film devices
KW - Lanthanum alloys
KW - Capacitors
KW - Piezoelectric property
KW - Thermal effects
KW - Pulsed laser applications
KW - Partial pressure
KW - Lead alloys
KW - Lead magnesium niobate lead titanate film
KW - Oxide electrode
KW - Scanned probe microscope
AU - V Nagarajan
AU - S.P Alpay
AU - C.S Ganpule
AU - B Nagaraj
AU - S Aggarwal
AU - A.L Roytburd
AU - E.D Williams
AU - Ramamoorthy Ramesh
AB - The effect of substrate induced constraint and misfit strain on the structure and piezoelectric properties of epitaxial relaxor ferroelectric lead magnesium niobate-lead titanate (PMN-PT) films were investigated. Relaxor PMN-PT epitaxial 100-400 nm thick films with top and bottom oxide electrodes were grown by pulsed laser deposition on (100) LaAlO3 substrates. A systematic decrease in the temperature of the dielectric maximum with increasing film thickness was observed. This is accompanied by an increase in the room temperature relative dielectric constant. The longitudinal piezoelectric coefficient measured using a scanned probe microscope, increases by almost an order of magnitude with increasing film thickness.
BT - Proceedings of the Materials Research Society Symposium -
LA - eng
N1 - cited By 0
N2 - The effect of substrate induced constraint and misfit strain on the structure and piezoelectric properties of epitaxial relaxor ferroelectric lead magnesium niobate-lead titanate (PMN-PT) films were investigated. Relaxor PMN-PT epitaxial 100-400 nm thick films with top and bottom oxide electrodes were grown by pulsed laser deposition on (100) LaAlO3 substrates. A systematic decrease in the temperature of the dielectric maximum with increasing film thickness was observed. This is accompanied by an increase in the room temperature relative dielectric constant. The longitudinal piezoelectric coefficient measured using a scanned probe microscope, increases by almost an order of magnitude with increasing film thickness.
PB - Materials Research Society, Warrendale, PA, United States
PY - 2000
SP - 505
EP - 510
T2 - Proceedings of the Materials Research Society Symposium -
T3 - Materials Research Society Symposium -
TI - Epitaxial PMN-PT relaxor thin films: dependence of dielectric and piezoelectric properties on film thickness
VL - 596
SN - 02729172
ER -