TY - JOUR
KW - Nucleation
KW - Pulsed laser deposition
KW - Crystal orientation
KW - Electrodes
KW - Atomic force microscopy
KW - Strontium titanate
KW - Lead compounds
KW - Ferroelectric thin films
KW - Lead zirconate titanate (PZT)
KW - Light polarization
KW - Thickness measurement
KW - Piezoresponse microscopy
KW - Relaxation processes
KW - Lanthanum strontium cobalt oxides
AU - C.S Ganpule
AU - V Nagarajan
AU - H Li
AU - A.S Ogale
AU - A.D Martinez
AU - S.B Ogale
AU - S Aggarwall
AU - E Williams
AU - P De Wolf
AU - Ramamoorthy Ramesh
AB - We report observations of the ferroelectric domain structure in epitaxial lead zirconate titanate (PZT) ferroelectric thin films using piezoresponse microscopy. Epitaxial PZT films with a nominal composition of PbZr0.2Ti0.8O3 were deposited onto single crystal SrTiO3 substrates by pulsed laser deposition, with an epitaxial layer of La-Sr-Co-O as the bottom electrode. By manipulating the film thickness, a uniform 2-dimensional grid of 90° domains (a-domains, i.e., c-axis in the plane of the film) has been induced. Our studies show that the polarization direction in the film is substantially preferentially oriented and that nucleation of reverse 180° domains occurs preferentially at 90° domain interfaces. Polarization reversal occurs through the nucleation and subsequent growth of "semicircular/elliptical" reverse domains, which subsequently consume the entire region as a function of reversal time. The reversal is seen to fit a stretched exponential.
BT - Integrated Ferroelectrics
LA - eng
M1 - 1-4
N1 - cited By 5
N2 - We report observations of the ferroelectric domain structure in epitaxial lead zirconate titanate (PZT) ferroelectric thin films using piezoresponse microscopy. Epitaxial PZT films with a nominal composition of PbZr0.2Ti0.8O3 were deposited onto single crystal SrTiO3 substrates by pulsed laser deposition, with an epitaxial layer of La-Sr-Co-O as the bottom electrode. By manipulating the film thickness, a uniform 2-dimensional grid of 90° domains (a-domains, i.e., c-axis in the plane of the film) has been induced. Our studies show that the polarization direction in the film is substantially preferentially oriented and that nucleation of reverse 180° domains occurs preferentially at 90° domain interfaces. Polarization reversal occurs through the nucleation and subsequent growth of "semicircular/elliptical" reverse domains, which subsequently consume the entire region as a function of reversal time. The reversal is seen to fit a stretched exponential.
PB - Gordon and Breach Science Publishers Inc.
PY - 2001
SP - 199
EP - 208
T2 - Integrated Ferroelectrics
TI - Direct observation of domain dynamics in lead zirconate titanate thin films
VL - 32
SN - 10584587
ER -