TY - JOUR
KW - Thin films
KW - Pulsed laser deposition
KW - Annealing
KW - Anisotropy
KW - Surface roughness
KW - Film growth
KW - X-ray Diffraction
KW - Dislocations (crystals)
KW - Strain
KW - Ferromagnetic resonance
KW - Barium compounds
KW - Rutherford backscattering spectroscopy
KW - Metallic films
KW - Magnetocrystalline energy
KW - Magnetoelasticity
AU - L.V Saraf
AU - S.E Lofland
AU - A.V Cresce
AU - S.M Bhagat
AU - Ramamoorthy Ramesh
AB - Ferromagnetic resonance (FMR) and structural characteristics of BaFe12O19 films with minimal linewidths were discussed. These films were deposited on (0001) oriented alumina using optimized growth, annealing conditions, and pulsed laser deposition. Measurement of x-ray diffraction, Rutherford backscattering, magnetization, atomic force microscopy and FMR at 58 GHz was done for characterization of the films. It was shown that the intrinsic high frequency losses can be attained in these adequately annealed films, deposited on alumina by pulsed laser deposition.
BT - Applied Physics Letters
DO - 10.1063/1.1385348
LA - eng
M1 - 3
N1 - cited By 14
N2 - Ferromagnetic resonance (FMR) and structural characteristics of BaFe12O19 films with minimal linewidths were discussed. These films were deposited on (0001) oriented alumina using optimized growth, annealing conditions, and pulsed laser deposition. Measurement of x-ray diffraction, Rutherford backscattering, magnetization, atomic force microscopy and FMR at 58 GHz was done for characterization of the films. It was shown that the intrinsic high frequency losses can be attained in these adequately annealed films, deposited on alumina by pulsed laser deposition.
PY - 2001
SP - 385
EP - 387
T2 - Applied Physics Letters
TI - Structural and ferromagnetic resonance characteristics of BaFe12O19 films with minimal linewidths
VL - 79
SN - 00036951
ER -