TY - CPAPER
AU - C.S Ganpule
AU - A.L Roytburd
AU - V Nagarajan
AU - A Stanishevsky
AU - J Melngailis
AU - E.D Williams
AU - Ramamoorthy Ramesh
AB - Focused ion beam milling was used to fabricate ferroelectric islands in Pb-Zr-Ti-O thin films. The islands ranged in size from 200μm×200μm to 0.3μm×0.3μm. The inverse piezoelectric effect was studied in these islands as a function of their size by tracking the surface displacement of the top electrode of the island (under an applied electric field) using an atomic force microscope (AFM). It was found that there was a substantial increase in the piezoresponse as the size of the island decreased below 100μm×100μm. This increase was attributed to the elastic deformation of the substrate. © 2001 Materials Research Society.
BT - Proceedings of the Materials Research Society Symposium -
LA - eng
N1 - cited By 3
N2 - Focused ion beam milling was used to fabricate ferroelectric islands in Pb-Zr-Ti-O thin films. The islands ranged in size from 200μm×200μm to 0.3μm×0.3μm. The inverse piezoelectric effect was studied in these islands as a function of their size by tracking the surface displacement of the top electrode of the island (under an applied electric field) using an atomic force microscope (AFM). It was found that there was a substantial increase in the piezoresponse as the size of the island decreased below 100μm×100μm. This increase was attributed to the elastic deformation of the substrate. © 2001 Materials Research Society.
PY - 2001
SP - XVI
EP - XVII
T2 - Proceedings of the Materials Research Society Symposium -
T3 - Materials Research Society Symposium -
TI - Nanoscale electromechanical phenomena in ferroelectric thin films
VL - 655
SN - 02729172
ER -