TY - JOUR
KW - Atomic force microscopy
KW - Polarization
KW - Epitaxial growth
KW - Scanning tunneling microscopy (STM)
KW - Ferroelectric thin films
KW - Relative orientation
KW - Domain structure
KW - SrTiO
KW - Piezoresponse
KW - In-plane polarization
KW - Out-of-plane
KW - Polydomain
KW - Atomic force microscope (AFM)
KW - Differential signal
KW - Polarization vectors
AU - C.S Ganpule
AU - V Nagarajan
AU - B.K Hill
AU - A.L Roytburd
AU - E.D Williams
AU - Ramamoorthy Ramesh
AU - S.P Alpay
AU - A Roelofs
AU - R Waser
AU - L.M Eng
AB - Voltage-modulated scanning force microscopy (Piezoresponse microscopy) is applied to investigate the domain structure in epitaxial PbZr 0.2Ti 0.8O 3 ferroelectric thin films grown on (001) SrTiO 3. By monitoring the vertical and lateral differential signals from the photodetector of the atomic force microscope it is possible to separate out and observe the out-of-plane and in-plane polarization vectors in the thin film individually. The relative orientation of the polarization vectors across a 90° domain wall is observed. Nucleation of new reversed 180° domains at the 90° domain wall is studied and its impact on the rotation of polarization within the a domain is analyzed as a function of reversal time. © 2002 American Institute of Physics.
BT - Journal of Applied Physics
DO - 10.1063/1.1421219
LA - eng
M1 - 3
N1 - cited By 121
N2 - Voltage-modulated scanning force microscopy (Piezoresponse microscopy) is applied to investigate the domain structure in epitaxial PbZr 0.2Ti 0.8O 3 ferroelectric thin films grown on (001) SrTiO 3. By monitoring the vertical and lateral differential signals from the photodetector of the atomic force microscope it is possible to separate out and observe the out-of-plane and in-plane polarization vectors in the thin film individually. The relative orientation of the polarization vectors across a 90° domain wall is observed. Nucleation of new reversed 180° domains at the 90° domain wall is studied and its impact on the rotation of polarization within the a domain is analyzed as a function of reversal time. © 2002 American Institute of Physics.
PY - 2002
SP - 1477
EP - 1481
T2 - Journal of Applied Physics
TI - Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films
VL - 91
SN - 00218979
ER -