TY - JOUR
KW - Lattice constants
KW - Ferroelectric materials
KW - X-ray scattering
KW - Lead compounds
KW - Grain boundaries
KW - Pulsed laser applications
KW - Grazing incident x-ray scattering (GIXS)
AU - Y Li
AU - V Nagarajan
AU - S Aggarwal
AU - Ramamoorthy Ramesh
AU - L.G Salamanca-Riba
AU - L.J Martínez-Miranda
AB - Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films was carried out using grazing incident x-ray scattering (GIXS) method. GIXS measurements show the evolution of in-plane compression of the lattice parameter as a function of depth within the films. The results indicate that measured in-plane lattice parameters are asymmetric, which suggest an orthorhombic distortion of the lattice in the plane of the films.
BT - Journal of Applied Physics
DO - 10.1063/1.1513195
LA - eng
M1 - 11
N1 - cited By 16
N2 - Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films was carried out using grazing incident x-ray scattering (GIXS) method. GIXS measurements show the evolution of in-plane compression of the lattice parameter as a function of depth within the films. The results indicate that measured in-plane lattice parameters are asymmetric, which suggest an orthorhombic distortion of the lattice in the plane of the films.
PY - 2002
SP - 6762
EP - 6767
T2 - Journal of Applied Physics
TI - Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films
VL - 92
SN - 00218979
ER -