TY - CPAPER
KW - Nucleation
KW - Semiconductor growth
KW - Optical microscopy
KW - Nanotechnology
KW - Lead compounds
KW - Ferroelectric thin films
KW - Relaxation processes
KW - 2-dimensional grid
KW - Polarization vector
KW - Relaxation dynamics
KW - Scanning force microscopy (SFM)
AU - V Nagarajan
AU - C.S Ganpule
AU - A Roytburd
AU - Ramamoorthy Ramesh
AB - This paper reviews recent progress in our group in the area of thin film ferroelectrics. Specific focus is on nanoscale phenomena and relaxation dynamics in model thin films using voltage modulated scanning force microscopy. Using this technique we show the 3 dimensional reconstruction of the polarization vector in lead zirconate titanate(PZT) thin films. Secondly the time dependent relaxation of remanant polarization in epitaxial PZT ferroelectric thin films, containing a uniform 2-dimensional grid of 90° domains (c-axis in the plane of the film), has been investigated extensively. The 90° domain walls preferentially nucleate the 180° reverse domains during relaxation. Relaxation occurs through the nucleation and growth of reverse 180° domains, which subsequently coalesce and consume the entire region as a function of relaxation time. The kinetics of relaxation is modeled through the Johnson-Mehl-Avrami-Kolmogorov approach with a decreasing driving force. In addition we also present results on investigation of the relaxation phenomenon on a very local scale, where pinning and bowing of domain walls has been observed. © 2002 Taylor & Francis.
BT - Integrated Ferroelectrics
DO - 10.1080/10584580210862
LA - eng
N1 - cited By 0
N2 - This paper reviews recent progress in our group in the area of thin film ferroelectrics. Specific focus is on nanoscale phenomena and relaxation dynamics in model thin films using voltage modulated scanning force microscopy. Using this technique we show the 3 dimensional reconstruction of the polarization vector in lead zirconate titanate(PZT) thin films. Secondly the time dependent relaxation of remanant polarization in epitaxial PZT ferroelectric thin films, containing a uniform 2-dimensional grid of 90° domains (c-axis in the plane of the film), has been investigated extensively. The 90° domain walls preferentially nucleate the 180° reverse domains during relaxation. Relaxation occurs through the nucleation and growth of reverse 180° domains, which subsequently coalesce and consume the entire region as a function of relaxation time. The kinetics of relaxation is modeled through the Johnson-Mehl-Avrami-Kolmogorov approach with a decreasing driving force. In addition we also present results on investigation of the relaxation phenomenon on a very local scale, where pinning and bowing of domain walls has been observed. © 2002 Taylor & Francis.
PY - 2002
SP - 173
EP - 189
T2 - Integrated Ferroelectrics
T3 - Integrated Ferroelectrics
TI - Nanoscale phenomena in ferroelectric thin films
VL - 42
SN - 10584587
ER -