TY - CPAPER
KW - Thin films
KW - Crystal structure
KW - Ferroelectric materials
KW - Dielectric materials
KW - Permittivity
KW - Magnetic domains
KW - 180° c-c domain wall
KW - 90° a-c domain wall
KW - Linear dielectric constant
KW - Nonlinear dielectric constant
KW - PZT thin films
KW - Scanning nonlinear dielectric microscopy
AU - Y Cho
AU - K Matsuura
AU - N Valanoor
AU - Ramamoorthy Ramesh
AB - Using Scanning Nonlinear Dielectric Microscopy (SNDM) which has attained sub-nanometer resolution, we measured the linear dielectric constant of a-domains and c-domains in the (1,0,0) and (0,0,1) oriented PbZr 0.2 Ti 0.8 O 3 thin film and confirmed that the dielectric constant of a-domain is higher than that of c-domain. Next, we observed 90 domain walls (a-c domain walls) and 180 domain walls (c-c domain walls) and we obtained the minimum value of 180 c-c domain wall thickness was 1.87 nm and 90 a-c domain wall was 2.52 nm.
BT - Ferroelectrics
DO - 10.1080/00150190390222961
LA - eng
N1 - cited By 1
N2 - Using Scanning Nonlinear Dielectric Microscopy (SNDM) which has attained sub-nanometer resolution, we measured the linear dielectric constant of a-domains and c-domains in the (1,0,0) and (0,0,1) oriented PbZr 0.2 Ti 0.8 O 3 thin film and confirmed that the dielectric constant of a-domain is higher than that of c-domain. Next, we observed 90 domain walls (a-c domain walls) and 180 domain walls (c-c domain walls) and we obtained the minimum value of 180 c-c domain wall thickness was 1.87 nm and 90 a-c domain wall was 2.52 nm.
PY - 2003
SP - 171
EP - 180
T2 - Ferroelectrics
T3 - Ferroelectrics
TI - Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy
VL - 292
SN - 00150193
ER -