TY - JOUR
KW - Electrodes
KW - Scanning electron microscopy
KW - Nanostructured materials
KW - Elasticity
KW - Computer simulation
KW - Single crystals
KW - Strontium compounds
KW - Heterojunctions
KW - Ferroelectric thin films
KW - Capacitors
KW - Semiconducting lead compounds
KW - Piezoresponse
KW - Finite element method
KW - Epitaxial heterostructures
KW - Nanostructured ferroelectric films
KW - Mathematical models
AU - J.-H Li
AU - L Chen
AU - V Nagarajan
AU - Ramamoorthy Ramesh
AU - A.L Roytburd
AB - The converse piezoresponse measured by the surface displacement of ferroelectric islands, with lateral size changing from a nanoscale to a continuous film was modeled by using three-dimensional finite element method. It was shown that the piezodeformation of the islands results in a local deformation of a substrate in the vicinity of island. The piezoresponse of different size island capacitors with PbZr 0.5Ti 0.5O 3/SrTiO 3/Si and PbZr 0.2Ti 0.8O 3/SrTiO 3 heterostructures was also calculated. The patterning thin ferroelectric films into discrete islands was an effective way to release the constraint imposed by a substrate.
BT - Applied Physics Letters
DO - 10.1063/1.1695641
LA - eng
M1 - 14
N1 - cited By 56
N2 - The converse piezoresponse measured by the surface displacement of ferroelectric islands, with lateral size changing from a nanoscale to a continuous film was modeled by using three-dimensional finite element method. It was shown that the piezodeformation of the islands results in a local deformation of a substrate in the vicinity of island. The piezoresponse of different size island capacitors with PbZr 0.5Ti 0.5O 3/SrTiO 3/Si and PbZr 0.2Ti 0.8O 3/SrTiO 3 heterostructures was also calculated. The patterning thin ferroelectric films into discrete islands was an effective way to release the constraint imposed by a substrate.
PY - 2004
SP - 2626
EP - 2628
T2 - Applied Physics Letters
TI - Finite element modeling of piezoresponse in nanostructured ferroelectric films
VL - 84
SN - 00036951
ER -