TY - JOUR
KW - Film growth
KW - Crystal structure
KW - Crystallography
KW - Bismuth compounds
KW - Ferroelectricity
KW - Ferroelectric domain structure
KW - Polarization direction
KW - Piezoelectric force microscopy (PEM)
KW - Light polarization
KW - In-plane piezoresponse
KW - Cantilever beams
AU - F Zavaliche
AU - R.R Das
AU - D.M Kim
AU - C.B Eom
AU - S.Y Yang
AU - P Shafer
AU - Ramamoorthy Ramesh
AB - Piezoelectric force microscopy is employed to study the ferroelectric domain structure in a 600 nm thick epitaxial BiFe O3 film. In the as-grown film, a mosaic-like domain structure is observed. Scans taken with the cantilever pointing along the principal crystallographic directions enabled us to reconstruct the polarization direction. By combining the perpendicular and in-plane piezoresponse data, we found that the ferroelectric domain structure is mainly described by four polarization directions. These directions point oppositely along two body diagonals, which form an angle of ∼71°. The other variants are also occasionally observed. © 2005 American Institute of Physics.
BT - Applied Physics Letters
DO - 10.1063/1.2126804
LA - eng
M1 - 18
N1 - cited By 95
N2 - Piezoelectric force microscopy is employed to study the ferroelectric domain structure in a 600 nm thick epitaxial BiFe O3 film. In the as-grown film, a mosaic-like domain structure is observed. Scans taken with the cantilever pointing along the principal crystallographic directions enabled us to reconstruct the polarization direction. By combining the perpendicular and in-plane piezoresponse data, we found that the ferroelectric domain structure is mainly described by four polarization directions. These directions point oppositely along two body diagonals, which form an angle of ∼71°. The other variants are also occasionally observed. © 2005 American Institute of Physics.
PY - 2005
SP - 1
EP - 3
T2 - Applied Physics Letters
TI - Ferroelectric domain structure in epitaxial BiFeO 3 films
VL - 87
SN - 00036951
ER -