TY - JOUR
KW - Sputtering
KW - Thin films
KW - Transmission electron microscopy
KW - Ferroelectric materials
KW - Epitaxial growth
KW - Bismuth compounds
KW - Ferroelectricity
KW - Ferroelectric domains
KW - X-ray Diffraction
KW - Ferroelectric properties
KW - Synthesis (chemical)
KW - BiFeO3 thin film
KW - Rhombohedral symmetry
KW - Light polarization
AU - R.R Das
AU - D.M Kim
AU - S.H Baek
AU - C.B Eom
AU - F Zavaliche
AU - S.Y Yang
AU - Ramamoorthy Ramesh
AU - Y.B Chen
AU - X.Q Pan
AU - X Ke
AU - M.S Rzchowski
AU - S.K Streiffer
AB - We have grown epitaxial BiFe O3 thin films with smooth surfaces on (001), (101), and (111) SrTi O3 substrates using sputtering. Four-circle x-ray diffraction and cross-sectional transmission electron microscopy show that the BiFe O3 thin films have rhombohedral symmetry although small monoclinic distortions have not been ruled out. Stripe ferroelectric domains oriented perpendicular to the substrate miscut direction and free of impurity phase are observed in BiFe O3 on high miscut (4°) (001) SrTi O3, which attributes to a relatively high value of remanent polarization (∼71 μC cm2). Films grown on low miscut (0.8°) SrTi O3 have a small amount of impure phase α- Fe2 O3 which contributes to lower the polarization values (∼63 μC cm2). The BiFe O3 films grown on (101) and (111) SrTi O3 exhibited remanent polarizations of 86 and 98 μC cm2, respectively. © 2006 American Institute of Physics.
BT - Applied Physics Letters
DO - 10.1063/1.2213347
LA - eng
M1 - 24
N1 - cited By 223
N2 - We have grown epitaxial BiFe O3 thin films with smooth surfaces on (001), (101), and (111) SrTi O3 substrates using sputtering. Four-circle x-ray diffraction and cross-sectional transmission electron microscopy show that the BiFe O3 thin films have rhombohedral symmetry although small monoclinic distortions have not been ruled out. Stripe ferroelectric domains oriented perpendicular to the substrate miscut direction and free of impurity phase are observed in BiFe O3 on high miscut (4°) (001) SrTi O3, which attributes to a relatively high value of remanent polarization (∼71 μC cm2). Films grown on low miscut (0.8°) SrTi O3 have a small amount of impure phase α- Fe2 O3 which contributes to lower the polarization values (∼63 μC cm2). The BiFe O3 films grown on (101) and (111) SrTi O3 exhibited remanent polarizations of 86 and 98 μC cm2, respectively. © 2006 American Institute of Physics.
PY - 2006
T2 - Applied Physics Letters
TI - Synthesis and ferroelectric properties of epitaxial BiFeO 3 thin films grown by sputtering
VL - 88
SN - 00036951
ER -