TY - JOUR
KW - Nucleation
KW - Nanostructured materials
KW - In situ
KW - Atomic force microscopy
KW - Ferroelectric materials
KW - Epitaxial growth
KW - Nanotechnology
KW - Ferroelectricity
KW - Ferroelectric domains
KW - Image enhancement
KW - Scanning probe microscopy
KW - Imaging techniques
KW - Piezoresponse force microscopy (PFM)
KW - Consecutive images
KW - High speeds
KW - Temporal resolutions
KW - Microscopic examination
KW - Speed
KW - Acquisition rates
KW - Dynamic studies
KW - Image frames
KW - Nanoscale resolution
KW - Nanoscale imaging
KW - Piezo-force microscopy
KW - Piezoactuation
AU - R Nath
AU - Y.-H Chu
AU - N.A Polomoff
AU - Ramamoorthy Ramesh
AU - B.D Huey
AB - An atomic force microscopy (AFM) based technique is described for mapping piezoactuation with nanoscale resolution in less than a second per complete image frame. "High speed piezo force microscopy" (HSPFM) achieves this <100× increase in acquisition rates by coupling a commercial AFM with concepts of acoustics. This allows previously inaccessible dynamic studies, including measuring ferroelectric domain nucleation and growth during in situ poling. Hundreds of consecutive images are analyzed with 49 μs temporal resolution per pixel per frame, revealing 32 nucleation sites/ μ m2 with 36 μm/s average domain velocities. HSPFM images acquired in as fast as 1/10 th s are also presented. © 2008 American Institute of Physics.
BT - Applied Physics Letters
DO - 10.1063/1.2969045
LA - eng
M1 - 7
N1 - cited By 57
N2 - An atomic force microscopy (AFM) based technique is described for mapping piezoactuation with nanoscale resolution in less than a second per complete image frame. "High speed piezo force microscopy" (HSPFM) achieves this <100× increase in acquisition rates by coupling a commercial AFM with concepts of acoustics. This allows previously inaccessible dynamic studies, including measuring ferroelectric domain nucleation and growth during in situ poling. Hundreds of consecutive images are analyzed with 49 μs temporal resolution per pixel per frame, revealing 32 nucleation sites/ μ m2 with 36 μm/s average domain velocities. HSPFM images acquired in as fast as 1/10 th s are also presented. © 2008 American Institute of Physics.
PY - 2008
T2 - Applied Physics Letters
TI - High speed piezoresponse force microscopy: <1 frame per second nanoscale imaging
VL - 93
SN - 00036951
ER -