TY - CPAPER
KW - Nanostructured materials
KW - In situ
KW - Nanotechnology
KW - Switching
KW - Direct observations
KW - Growth mechanisms
KW - Domain switching dynamics
KW - Image acquisition
KW - Consecutive images
KW - Domain nucleations
KW - Domain switching
KW - Force microscopies
KW - High speeds
KW - Nanoseconds
KW - Nanoscale
KW - Nanoscale measurements
KW - Switching energies
KW - Switching speeds
KW - Temporal resolutions
AU - R Nath
AU - N Polomoff
AU - J Bosse
AU - Y.H Chu
AU - Ramamoorthy Ramesh
AU - B.D Huey
AB - High Speed Piezo Force Microscopy (HSPFM) is a new variation of Atomic Force Miroscopy (AFM) for direct nanoscale measurements of domain switching dynamics. Image acquisition is accelerated from several minutes for standard piezo force microscopy to as fast as a fraction of a second for HSPFM. Movies of consecutive images during in-situ domain switching therefore allow high spatial and temporal resolution, with less than 500 nanosecond poling per pixel achieved. The influence of individual defects on domain nucleation, growth mechanisms, switching speed, and switching energy are therefore uniquely apparent.
BT - IEEE International Symposium on Applications of Ferroelectrics
DO - 10.1109/ISAF.2008.4693907
LA - eng
N1 - cited By 0
N2 - High Speed Piezo Force Microscopy (HSPFM) is a new variation of Atomic Force Miroscopy (AFM) for direct nanoscale measurements of domain switching dynamics. Image acquisition is accelerated from several minutes for standard piezo force microscopy to as fast as a fraction of a second for HSPFM. Movies of consecutive images during in-situ domain switching therefore allow high spatial and temporal resolution, with less than 500 nanosecond poling per pixel achieved. The influence of individual defects on domain nucleation, growth mechanisms, switching speed, and switching energy are therefore uniquely apparent.
PY - 2008
SN - 1424427444; 9781424427444
T2 - IEEE International Symposium on Applications of Ferroelectrics
T3 - IEEE International Symposium on Applications of Ferroelectrics
TI - High speed piezo force microscopy: Nanoscale and nanosecond direct observations of domain switching
VL - 1
ER -