TY - JOUR
KW - Pulsed laser deposition
KW - Platinum
KW - Substrates
KW - Temperature range
KW - Capacitance
KW - Electrode interface
KW - Capacitors
KW - Electrolytic capacitors
KW - Current-voltage measurements
KW - Potential barriers
KW - Pt electrode
KW - Nuclear physics
AU - L Pintilie
AU - C Dragoi
AU - Y.H Chu
AU - L.W Martin
AU - Ramamoorthy Ramesh
AU - M Alexe
AB - The leakage current in epitaxial BiFeO3 capacitors with bottom SrRuO3 and top Pt electrodes, grown by pulsed laser deposition on SrTiO3 (100), SrTiO3 (110), and SrTiO3 (111) substrates, is investigated by current-voltage (I-V) measurements in the 100-300 K temperature range. It is found that the leakage current is interface-limited and strongly dependent on the orientation of the substrate. The potential barriers at the electrode interfaces are estimated to about 0.6, 0.77, and 0.93 eV for the (100), (110), and (111) orientations, respectively. © 2009 American Institute of Physics.
BT - Applied Physics Letters
DO - 10.1063/1.3152784
LA - eng
M1 - 23
N1 - cited By 59
N2 - The leakage current in epitaxial BiFeO3 capacitors with bottom SrRuO3 and top Pt electrodes, grown by pulsed laser deposition on SrTiO3 (100), SrTiO3 (110), and SrTiO3 (111) substrates, is investigated by current-voltage (I-V) measurements in the 100-300 K temperature range. It is found that the leakage current is interface-limited and strongly dependent on the orientation of the substrate. The potential barriers at the electrode interfaces are estimated to about 0.6, 0.77, and 0.93 eV for the (100), (110), and (111) orientations, respectively. © 2009 American Institute of Physics.
PY - 2009
T2 - Applied Physics Letters
TI - Orientation-dependent potential barriers in case of epitaxial Pt- BiFeO3 - SrRuO3 capacitors
VL - 94
SN - 00036951
ER -