TY - JOUR
KW - Manganese compounds
KW - Hysteresis
KW - Defects
KW - Ferroelectric films
KW - Magnetic materials
KW - Ferroelectric thin films
KW - Spatially resolved
KW - Domain nucleation
KW - Ambient environment
KW - Defect cluster
KW - Electrostatic effect
KW - Local defects
KW - Piezoresponse
KW - Single defect
KW - Electrostatics
KW - Semiconducting bismuth compounds
KW - Vacuum
KW - Hysteresis loops
AU - P Maksymovych
AU - N Balke
AU - S Jesse
AU - M Huijben
AU - Ramamoorthy Ramesh
AU - A.P Baddorf
AU - S.V Kalinin
AB - Local piezoresponse hysteresis loops were systematically studied on the surface of ferroelectric thin films of BiFeO3 grown on SrRuO 3 and La0.7Sr0.3MnO3 electrodes and compared between ultrahigh vacuum and ambient environment. The loops on all the samples exhibited characteristic asymmetry manifested in the difference of the piezoresponse slope following local domain nucleation. Spatially resolved mapping has revealed that the asymmetry is strongly correlated with the random-field disorder inherent in the films and is not affected by the random-bond disorder component. The asymmetry thus originates from electrostatic disorder within the film, which allows using it as a unique signature of single defects or defect clusters. The electrostatic effects due to the measurement environment also contribute to the total asymmetry of the piezoresponse loop, albeit with a much smaller magnitude compared to local defects. © 2009 Springer Science+Business Media, LLC.
BT - Journal of Materials Science
DO - 10.1007/s10853-009-3697-z
LA - eng
M1 - 19
N1 - cited By 25
N2 - Local piezoresponse hysteresis loops were systematically studied on the surface of ferroelectric thin films of BiFeO3 grown on SrRuO 3 and La0.7Sr0.3MnO3 electrodes and compared between ultrahigh vacuum and ambient environment. The loops on all the samples exhibited characteristic asymmetry manifested in the difference of the piezoresponse slope following local domain nucleation. Spatially resolved mapping has revealed that the asymmetry is strongly correlated with the random-field disorder inherent in the films and is not affected by the random-bond disorder component. The asymmetry thus originates from electrostatic disorder within the film, which allows using it as a unique signature of single defects or defect clusters. The electrostatic effects due to the measurement environment also contribute to the total asymmetry of the piezoresponse loop, albeit with a much smaller magnitude compared to local defects. © 2009 Springer Science+Business Media, LLC.
PY - 2009
SP - 5095
EP - 5101
T2 - Journal of Materials Science
TI - Defect-induced asymmetry of local hysteresis loops on BiFeO3 surfaces
VL - 44
SN - 00222461
ER -