TY - JOUR
KW - Electricity
KW - Transmission electron microscopy
KW - Microscopy
KW - Oxide
KW - Oxides
KW - Electron
KW - Chemistry
KW - Electric fields
KW - Polarization
KW - Article
KW - Scanning transmission electron microscopy
KW - Scanning Transmission
KW - Z-contrast imaging
KW - Atomic displacement
KW - Displacement profiles
KW - Ferroelectric interface
KW - Interface charge
KW - Landau-Ginsburg-Devonshire theory
KW - Real-space
KW - STEM images
AU - H.J Chang
AU - S.V Kalinin
AU - A.N Morozovska
AU - M Huijben
AU - Y.-H Chu
AU - P Yu
AU - Ramamoorthy Ramesh
AU - E.A Eliseev
AU - G.S Svechnikov
AU - S.J Pennycook
AU - A.Y Borisevich
AB - Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
BT - Advanced Materials
DO - 10.1002/adma.201004641
LA - eng
M1 - 21
N1 - cited By 64
N2 - Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
PY - 2011
SP - 2474
EP - 2479
T2 - Advanced Materials
TI - Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging
VL - 23
SN - 09359648
ER -