TY - JOUR
KW - Thin films
KW - Electron energy loss spectroscopy
KW - Transmission electron microscopy
KW - Perovskite
KW - Electrons
KW - Vanadium
KW - Scanning transmission electron microscopy
KW - Lanthanum alloys
KW - Electronic properties
KW - Electronic structure
KW - Energy-loss near-edge structure
KW - Interface layer
KW - Local bonding
KW - Multi-electron
KW - Substrate surface
KW - Theoretical calculations
KW - Z-contrast imaging
KW - Vanadium alloys
AU - M Chi
AU - T Mizoguchi
AU - L.W Martin
AU - J.P Bradley
AU - H Ikeno
AU - Ramamoorthy Ramesh
AU - I Tanaka
AU - N Browning
AB - The atomic and electronic structures at interfaces in thin films are typically different from the bulk and are vitally important in determining the physical properties of thin films. The interface between SrVO3, chosen as a prototype for vanadium-based perovskite materials in this work, and LaAlO3 substrate is investigated by scanning transmission electron microscopy, electron energy-loss spectroscopy, and theoretical multi-electron calculations. Extra electrons have been detected on the interface layer by comparing the energy-loss near-edge structures of V-L3,2 edges to those from the film far from the interface. Monochromated EELS and theoretical calculations for SrVO3, VO2, and V2O 3 support this conclusion. The extra electrons appear to originate from a change in the local bonding configuration of V at the La-O terminated substrate surface as determined by Z-contrast imaging. © 2011 American Institute of Physics.
BT - Journal of Applied Physics
DO - 10.1063/1.3601870
LA - eng
M1 - 4
N1 - cited By 13
N2 - The atomic and electronic structures at interfaces in thin films are typically different from the bulk and are vitally important in determining the physical properties of thin films. The interface between SrVO3, chosen as a prototype for vanadium-based perovskite materials in this work, and LaAlO3 substrate is investigated by scanning transmission electron microscopy, electron energy-loss spectroscopy, and theoretical multi-electron calculations. Extra electrons have been detected on the interface layer by comparing the energy-loss near-edge structures of V-L3,2 edges to those from the film far from the interface. Monochromated EELS and theoretical calculations for SrVO3, VO2, and V2O 3 support this conclusion. The extra electrons appear to originate from a change in the local bonding configuration of V at the La-O terminated substrate surface as determined by Z-contrast imaging. © 2011 American Institute of Physics.
PY - 2011
T2 - Journal of Applied Physics
TI - Atomic and electronic structures of the SrVO3-LaAlO3 interface
VL - 110
SN - 00218979
ER -