TY - JOUR
KW - Perovskite
KW - Magnetic materials
KW - Broad frequency range
KW - Different frequency
KW - Evanescent fields
KW - Field distribution
KW - Image contrasts
KW - Micro-spectroscopy
KW - Near-field microscopy
KW - Scattering and absorption
KW - Superlenses
KW - Superlensing
KW - Electrical engineering
AU - S.C Kehr
AU - P Yu
AU - Y Liu
AU - M Parzefall
AU - A.I Khan
AU - R Jacob
AU - M.T Wenzel
AU - H.-G von Ribbeck
AU - M Helm
AU - X Zhang
AU - L.M Eng
AU - Ramamoorthy Ramesh
AB - Superlenses create sub-diffraction-limit images by reconstructing the evanescent fields arising from an object. We study the lateral, vertical, and spectral field distribution of three different perovskite-based superlenses by means of scattering-type near-field microscopy. Subdiffraction-limit resolution is observed for all samples with an image contrast depending on losses such as scattering and absorption. For the three lenses superlensing is observed at slightly different frequencies resulting in an overall broad frequency range of 3.6 THz around 20 THz. © 2011 Optical Society of America.
BT - Optical Materials Express
DO - 10.1364/OME.1.001051
LA - eng
M1 - 5
N1 - cited By 13
N2 - Superlenses create sub-diffraction-limit images by reconstructing the evanescent fields arising from an object. We study the lateral, vertical, and spectral field distribution of three different perovskite-based superlenses by means of scattering-type near-field microscopy. Subdiffraction-limit resolution is observed for all samples with an image contrast depending on losses such as scattering and absorption. For the three lenses superlensing is observed at slightly different frequencies resulting in an overall broad frequency range of 3.6 THz around 20 THz. © 2011 Optical Society of America.
PY - 2011
SP - 1051
EP - 1060
T2 - Optical Materials Express
TI - Microspectroscopy on perovskite-based superlenses [Invited]
VL - 1
SN - 21593930
ER -