TY - JOUR
KW - Thin films
KW - Electron energy loss spectroscopy
KW - Transmission electron microscopy
KW - Dissociation
KW - Multiferroics
KW - Scanning transmission electron microscopy
KW - Atoms
KW - Bismuth
KW - Electronic structure
KW - Highly strained
KW - Atomic-resolution
KW - Direct imaging
KW - Fe atoms
KW - R phase
KW - Spontaneous polarizations
KW - T-phase
KW - Atomic spectroscopy
KW - Electron energy levels
KW - Electron scattering
AU - M.D Rossell
AU - R Erni
AU - M.P Prange
AU - J.-C Idrobo
AU - W Luo
AU - R.J Zeches
AU - S.T Pantelides
AU - Ramamoorthy Ramesh
AB - We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO 3 thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO 3 thin films. © 2012 American Physical Society.
BT - Physical Review Letters
DO - 10.1103/PhysRevLett.108.047601
LA - eng
M1 - 4
N1 - cited By 79
N2 - We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO 3 thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO 3 thin films. © 2012 American Physical Society.
PY - 2012
T2 - Physical Review Letters
TI - Atomic structure of highly strained BiFeO 3 thin films
VL - 108
SN - 00319007
ER -