TY - JOUR
KW - Ferroelectric materials
KW - Ferroelectricity
KW - Ferroelectric domains
KW - Electron microscopes
KW - Imaging techniques
KW - Polymer blends
KW - Electronic conductance
KW - Energy distributions
KW - Ferroelectric domain structure
KW - High spatial resolution
KW - Photoemission electron microscopy
KW - Scope of application
KW - X-ray-photo-emission electron microscopies
AU - J Schaab
AU - I.P Krug
AU - F Nickel
AU - D.M Gottlob
AU - H. Doǧ Anay
AU - A Cano
AU - M Hentschel
AU - Z Yan
AU - E Bourret
AU - C.M Schneider
AU - Ramamoorthy Ramesh
AU - D Meier
AB - High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contact-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics. © 2014 AIP Publishing LLC.
BT - Applied Physics Letters
DO - 10.1063/1.4879260
LA - eng
M1 - 23
N1 - cited By 17
N2 - High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contact-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics. © 2014 AIP Publishing LLC.
PB - American Institute of Physics Inc.
PY - 2014
T2 - Applied Physics Letters
TI - Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy
VL - 104
SN - 00036951
ER -