TY - CPAPER
KW - Energy efficiency
KW - Iron
KW - Transient analysis
KW - Ferroelectricity
KW - Negative capacitance
KW - Ferroelectric devices
KW - Ferroelectric capacitors
KW - Single-crystalline
KW - Capacitance
KW - Ferroelectric switching
KW - Capacitors
KW - Resistors
KW - Semiconductor devices
KW - Switches
KW - External resistors
KW - Semiconductor device measurements
KW - Subthreshold characteristics
KW - Transistor structure
AU - A.I Khan
AU - K Chatterjee
AU - Ramamoorthy Ramesh
AU - S Salahuddin
AB - We investigate negative capacitance transients-the time period during ferroelectric switching when the voltage across a ferroelectric changes in a direction opposite to that of the charge-by constructing a simple series network of an isolated single crystalline ferroelectric capacitor and an external resistor. A study of negative capacitance dynamics in such a circuit reveals that the time scale of this phenomenon is controlled by the external resistor rather than by the material dependent intrinsic speeds. As a canonical approach for directly measuring ferroelectric negative capacitance, these experiments could guide the efforts to stabilize negative capacitance in a transistor structure for sub-60 mV/decade subthreshold characteristics as well as help assess negative capacitance response speed at technologically relevant dimensions. © 2015 IEEE.
BT - Proceedings of the 2015 4th Berkeley Symposium on Energy Efficient Electronic Systems, E3S 2015 -
DO - 10.1109/E3S.2015.7336793
LA - eng
N1 - cited By 2
N2 - We investigate negative capacitance transients-the time period during ferroelectric switching when the voltage across a ferroelectric changes in a direction opposite to that of the charge-by constructing a simple series network of an isolated single crystalline ferroelectric capacitor and an external resistor. A study of negative capacitance dynamics in such a circuit reveals that the time scale of this phenomenon is controlled by the external resistor rather than by the material dependent intrinsic speeds. As a canonical approach for directly measuring ferroelectric negative capacitance, these experiments could guide the efforts to stabilize negative capacitance in a transistor structure for sub-60 mV/decade subthreshold characteristics as well as help assess negative capacitance response speed at technologically relevant dimensions. © 2015 IEEE.
PB - Institute of Electrical and Electronics Engineers Inc.
PY - 2015
SN - 9781467385688
T2 - Proceedings of the 2015 4th Berkeley Symposium on Energy Efficient Electronic Systems, E3S 2015 -
T3 - 2015 4th Berkeley Symposium on Energy Efficient Electronic Systems, E3S 2015 -
TI - Understanding negative capacitance dynamics in ferroelectric capacitors
ER -