TY - JOUR
KW - Manganese compounds
KW - Lanthanum compounds
KW - BiFeO3
KW - Energy gap
KW - Interface states
KW - Strontium compounds
KW - Hetero-interfaces
KW - Scanning tunneling microscopy (STM)
KW - Electronic states
KW - Cross-sectional scanning tunneling microscopies
KW - Electronic interface
KW - Interface property
KW - La0.7Sr0.3MnO3
KW - Magnetic interface properties
KW - Physical effects
AU - B.-C Huang
AU - P Yu
AU - Y.H Chu
AU - C.-S Chang
AU - Ramamoorthy Ramesh
AU - R.E Dunin-Borkowski
AU - P Ebert
AU - Y.-P Chiu
AB - We map electronic states, band gaps, and interface-bound charges at termination-engineered BiFeO3/La0.7Sr0.3MnO3 interfaces using atomically resolved cross-sectional scanning tunneling microscopy. We identify a delicate interplay of different correlated physical effects and relate these to the ferroelectric and magnetic interface properties tuned by engineering the atomic layer stacking sequence at the interfaces. This study highlights the importance of a direct atomically resolved access to electronic interface states for understanding the intriguing interface properties in complex oxides. © 2018 American Chemical Society.
BT - ACS Nano
DO - 10.1021/acsnano.7b06004
LA - eng
M1 - 2
N1 - cited By 5
N2 - We map electronic states, band gaps, and interface-bound charges at termination-engineered BiFeO3/La0.7Sr0.3MnO3 interfaces using atomically resolved cross-sectional scanning tunneling microscopy. We identify a delicate interplay of different correlated physical effects and relate these to the ferroelectric and magnetic interface properties tuned by engineering the atomic layer stacking sequence at the interfaces. This study highlights the importance of a direct atomically resolved access to electronic interface states for understanding the intriguing interface properties in complex oxides. © 2018 American Chemical Society.
PB - American Chemical Society
PY - 2018
SP - 1089
EP - 1095
T2 - ACS Nano
TI - Atomically Resolved Electronic States and Correlated Magnetic Order at Termination Engineered Complex Oxide Heterointerfaces
VL - 12
SN - 19360851
ER -