TY - JOUR KW - Model KW - Transformation KW - Temperature KW - USA KW - Surface KW - Pulse KW - Power KW - Films KW - Ablation KW - Laser KW - Laser ablation KW - Laser ablation KW - Time-resolved KW - Intensity KW - Crystal KW - State KW - Time KW - Ca KW - E KW - Liquid KW - Mass KW - Sample KW - Samples KW - Properties KW - Property KW - Single KW - C KW - Crater KW - Metals KW - Volume KW - Droplet KW - Droplets KW - Nanosecond KW - Aluminum KW - Inductively-coupled plasma KW - Size KW - Metal KW - Nanosecond laser KW - Depth KW - Microprobe KW - White-light KW - Silicon KW - Light KW - Gas-dynamics KW - Layer KW - Threshold KW - Plume KW - Irradiance KW - Pulse laser KW - Pulse laser ablation KW - Critical temperature KW - Physics KW - Single-crystal KW - Dielectric KW - Heat transfer KW - Thickness KW - Solidification KW - Transparency KW - Crater morphology KW - Critical state KW - Critical-state KW - Deep KW - Ejection KW - Morphology AU - Jong-Hyun Yoo AU - Sungho Jeong AU - Ralph Greif AU - Richard E Russo AB -

Mass removed from single crystal silicon samples by high irradiance (1×109 to 1×1011 W/cm2) single pulse laser ablation was studied by measuring the resulting crater morphology with a white light interferometric microscope. The craters show a strong nonlinear change in both the volume and depth when the laser irradiance is less than or greater than ≈2.2×1010 W/cm2. Time-resolved shadowgraph images of the ablated silicon plume were obtained over this irradiance range. The images show that the increase in crater volume and depth at the threshold of 2.2×1010 W/cm2 is accompanied by large size droplets leaving the silicon surface, with a time delay ∼300 ns. A numerical model was used to estimate the thickness of the layer heated to approximately the critical temperature. The model includes transformation of liquid metal into liquid dielectric near the critical state (i.e., induced transparency). In this case, the estimated thickness of the superheated layer at a delay time of 200–300 ns shows a close agreement with measured crater depths. Induced transparency is demonstrated to play an important role in the formation of a deep superheated liquid layer, with subsequent explosive boiling responsible for large-particulate ejection.

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Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Mech Engn, Berkeley, CA 94720 USA Kwangju Inst Sci & Technol, Kwangju 500712, South Korea

BT - Journal of Applied Physics C2 - LBNL-45733 DA - 08/2000 DO - 10.1063/1.373865 IS - 3 LA - eng LB - Laser N1 -

LBNL-45733 NOT IN FILE

N2 -

Mass removed from single crystal silicon samples by high irradiance (1×109 to 1×1011 W/cm2) single pulse laser ablation was studied by measuring the resulting crater morphology with a white light interferometric microscope. The craters show a strong nonlinear change in both the volume and depth when the laser irradiance is less than or greater than ≈2.2×1010 W/cm2. Time-resolved shadowgraph images of the ablated silicon plume were obtained over this irradiance range. The images show that the increase in crater volume and depth at the threshold of 2.2×1010 W/cm2 is accompanied by large size droplets leaving the silicon surface, with a time delay ∼300 ns. A numerical model was used to estimate the thickness of the layer heated to approximately the critical temperature. The model includes transformation of liquid metal into liquid dielectric near the critical state (i.e., induced transparency). In this case, the estimated thickness of the superheated layer at a delay time of 200–300 ns shows a close agreement with measured crater depths. Induced transparency is demonstrated to play an important role in the formation of a deep superheated liquid layer, with subsequent explosive boiling responsible for large-particulate ejection.

PY - 2000 SP - 1638 EP - 1649 ST - J. Appl. Phys. T2 - Journal of Applied Physics TI - Explosive change in crater properties during high power nanosecond laser ablation of silicon VL - 88 ER -