TY - JOUR
KW - Model
KW - Impact
KW - Measurements
KW - Measurement
KW - USA
KW - Transmission
KW - Surface
KW - Optical properties
KW - Experimental
KW - Films
KW - Time
KW - Ca
KW - Sample
KW - Samples
KW - Properties
KW - Property
KW - C
KW - Picosecond
KW - M
KW - Absorption
KW - Area
KW - Confinement
KW - Disorder
KW - Dynamics
KW - Electroluminescence
KW - Length
KW - Mn
KW - Nanocrystallites
KW - Nonlinear optical properties (NLO)
KW - Nonlinear optical properties (NLO)
KW - Nonlinear-transmission
KW - Optical property
KW - Optical-properties
KW - Porous silicon
KW - Porous silicon
KW - Results
KW - Silicon
AU - M. M Cynthia Hipwell
AU - Chang-Lin Tien
AU - Xianglei Mao
AU - Richard E Russo
AB - <p>In this work, differential transmission measurements are made to characterize the short-time-scale optical properties of p-type light-emitting porous silicon. Aged and freshly etched samples are used to determine the impact of aging on the nonlinear optical properties. Two-component photo-induced absorption is observed in both types of samples. A model that considers porous silicon's unique properties of confinement, high surface area, and disorder on several length scales is presented to explain the experimental results.</p>
AD - <p>Univ Calif Berkeley, Berkeley, CA 94720 USA Lawrence Berkeley Lab, Berkeley, CA USA</p>
BT - Microscale Thermophysical Engineering
C2 - LBNL-42475
DO - 10.1080/108939598200006
IS - 2
LA - eng
N1 - <p>LBNL-42475 NOT IN FILE</p>
N2 - <p>In this work, differential transmission measurements are made to characterize the short-time-scale optical properties of p-type light-emitting porous silicon. Aged and freshly etched samples are used to determine the impact of aging on the nonlinear optical properties. Two-component photo-induced absorption is observed in both types of samples. A model that considers porous silicon's unique properties of confinement, high surface area, and disorder on several length scales is presented to explain the experimental results.</p>
PY - 1998
RP - Laser
SP - 87
EP - 99
T2 - Microscale Thermophysical Engineering
TI - Picosecond differential transmission measurements on porous silicon
VL - 2
ER -