TY - JOUR KW - Measurements KW - Measurement KW - Orientation KW - Copper KW - X-ray Diffraction KW - Film KW - Thin films KW - A-axis KW - Anisotropy KW - Bulk KW - Conductors KW - Copper oxide KW - Critical-field KW - Crystallites KW - Determination KW - Diffraction KW - Field KW - Fields KW - High-tc KW - Layers KW - Magnetic field KW - Magnetic field KW - Magnetoresistance KW - Microscopy KW - O superconducting films KW - Oriented KW - Oxide KW - P KW - Plane KW - Resistance KW - Resistivity KW - State KW - Superconductor KW - Texture KW - Time KW - X-Ray KW - X-ray Diffraction KW - Yba2cu3ox AU - Paul H Berdahl AU - Xianglei Mao AU - Ronald P Reade AU - Michael D Rubin AU - Richard E Russo AU - E Yin AB -

Angular magnetoresistance measurements are performed by rotating a superconductor to an angle-theta in a fixed magnetic field, while monitoring the resistance R. It is argued theoretically that for fields well above the lower critical field, H much greater than H(cl), the bulk resistivity of the conductor is independent of theta if the crystallites of which it is composed are randomly oriented. Non-random orientation (a key aspect of texture) is revealed, therefore, by variations of R with theta. Dips in R indicate that the field is parallel to the copper oxide planes in a significant fraction of the current-carrying crystallites. C-axis, a-axis, and other textured film conductors are used to illustrate the technique. The angular magnetoresistance is found to be an important supplement to conventional texture determinations by microscopy and X-ray diffraction

AN - 28 BT - Physica C C2 - LBNL-31513 LA - eng LB - Laser N1 -

LBNL-31513 NOT IN FILE

N2 -

Angular magnetoresistance measurements are performed by rotating a superconductor to an angle-theta in a fixed magnetic field, while monitoring the resistance R. It is argued theoretically that for fields well above the lower critical field, H much greater than H(cl), the bulk resistivity of the conductor is independent of theta if the crystallites of which it is composed are randomly oriented. Non-random orientation (a key aspect of texture) is revealed, therefore, by variations of R with theta. Dips in R indicate that the field is parallel to the copper oxide planes in a significant fraction of the current-carrying crystallites. C-axis, a-axis, and other textured film conductors are used to illustrate the technique. The angular magnetoresistance is found to be an important supplement to conventional texture determinations by microscopy and X-ray diffraction

PY - 1992 SP - 93 EP - 102 T2 - Physica C TI - Angular Magnetoresistance Provides Texture Information on High-Tc Conductors VL - 195 ER -