TY - ECHAP
KW - Thin films
KW - Characterization
KW - Film
KW - Films
KW - Material
KW - Raman
KW - Raman scattering
KW - Raman-scattering
KW - Scattering
KW - Thin
KW - Thin film
KW - Thin-film
KW - Thin films
AU - Eric Faulques
AU - Richard E Russo
AU - Dale L Perry
BT - Applications of Analytical Techniques to the Characterization of Materials
C2 - LBNL-31913
CY - New York
LA - eng
LB - Laser
PB - Plenum Press
PP - New York
PY - 1992
SP - 59
EP - 100
T2 - Applications of Analytical Techniques to the Characterization of Materials
TI - Characterization of High Temperature Superconductors with Raman Spectroscopy
SN - 0-306-44189-6
ER -