@article{34457,
  author = {Peter Dudenas and Adam Z Weber and Ahmet Kusoglu},
  title = {Electric-field-intensity-modulated scattering as a thin-film depth probe},
  abstract = {<p><span>Grazing-incidence X-ray scattering is a common technique to elucidate nanostructural information for thin-film samples, but depth-resolving this nanostructure is difficult using a single or few images. An&nbsp;</span><span class="it"><em>in situ</em></span><span>&nbsp;method to extract film thickness, the index of refraction and depth information using scattering images taken across a range of incident angles is presented here. The technique is described within the multilayer distorted-wave Born approximation and validated using two sets of polymer thin films. Angular divergence and energy resolution effects are considered, and implementation of the technique as a general beamline procedure is discussed. Electric-field-intensity-modulated scattering is a general technique applicable to myriad materials and enables the acquisition of depth-sensitive information&nbsp;</span><span class="it"><em>in situ</em></span><span>&nbsp;at any grazing-incidence-capable beamline.</span></p>},
  year = {2020},
  journal = {Journal of Applied Crystallography},
  volume = {53},
  pages = {1484 - 1492},
  month = {11/2020},
  doi = {10.1107/S160057672001304710.1107/S1600576720013047/ge5076sup1.pdf},
  language = {eng},
}