@article{33966,
  author = {Ramamoorthy Ramesh and A Inam and W.K Chan and B Wilkens and F Tillerot and T Sands and J.M Tarascon and J Bullington and J Evans},
  title = {Ferroelectric pbzr0.2ti0.8o3 thin films on epitaxial y-ba-cu-o},
  abstract = {Using a combination of pulsed laser deposition and sol-gel processing, we have fabricated epitaxial PbZr0.2Ti0.8O3/YBa2Cu3O7-x heterostructures on single crystalline [001] LaAlO3- Rutherford Backscattering studies show the composition to be the same as the nominal starting composition. Transmission electron microscopy shows the existence of a randomly oriented polycrystalline microstructure in the PZT layer with a grain size of about 500–1000Å. Microscopic pores were also observed in the PZT layer. The PZT film exhibits ferroelectric hysteresis with a saturation polarization of 22–25μC/cm2 (at 7.5V, 1kHz), a remanence of 5–6μC/cm2 and a coercive field of about 40kV/cm. © 1992, Taylor & Francis Group, LLC. All rights reserved.},
  year = {1992},
  journal = {Integrated Ferroelectrics},
  volume = {1},
  number = {2-4},
  pages = {205-212},
  issn = {10584587},
  doi = {10.1080/10584589208215712},
  note = {cited By 0},
  language = {eng},
}