@article{33959,
  keywords = {Microstructure, Thin films, Transmission electron microscopy, Crystal orientation, Yttrium compounds, Copper oxides, Lanthanum compounds, Ferroelectric materials, Superlattices, High temperature superconductors, Lead compounds, Yttrium barium copper oxides, X-ray Analysis, Lead lanthanum zirconate titanates, X-ray diffractometry, Ceramic products},
  author = {S.G Ghonge and E Goo and Ramamoorthy Ramesh and T Sands and V.G Keramidas},
  title = {Microstructure of Epitaxial Ferroelectric YBa2Cu3O7−x/Pb0.9La0.1(Zr0.2Ti0.8)0.975O3/YBa2Cu3O7−x Heterostructures on LaAlO3},
  abstract = {The microstructure of an epitaxial YBa2Cu3O7−x/Pb0.9‐La0.1(Zr0.2Ti0.8)0.975O3/YBa2Cu3O7−x (YBCO/PLZT/YBCO) heterostructure on [001] LaAlO3 (LAO) has been investigated by X‐ray diffractometry and transmission electron microscopy. The ferroelectric film is c‐axis oriented and epitaxial with the underlying YBCO film. The YBCO film, which is b‐axis oriented, is epitaxial with the LAO substrate and shows two variants. Copyright © 1993, Wiley Blackwell. All rights reserved},
  year = {1993},
  journal = {Journal of the American Ceramic Society},
  volume = {76},
  number = {12},
  pages = {3141-3143},
  issn = {00027820},
  doi = {10.1111/j.1151-2916.1993.tb06619.x},
  note = {cited By 6},
  language = {eng},
}