@article{33950,
  keywords = {Thin films, Ablation, Superconducting films, Scanning electron microscopy, Pulsed laser ablation (PLA), Crystal growth, Ferroelectric materials, High temperature superconductors, Interfaces (materials), Laser pulses, Crystal microstructure, X-ray spectroscopy, Lead titanate thin films, Thermal expansion mismatch},
  author = {S.G Ghonge and E Goo and Ramamoorthy Ramesh},
  title = {Microstructure of c-axis oriented lead titanate thin films by pulsed laser ablation},
  abstract = {Epitaxial ferroelectric PbTiO3/YBa2Cu 3O7-x heterostructures have been fabricated on [001] LaAlO3 by pulsed laser ablation. X-ray diffractometer scans showed only the (00l) peaks from the lead titanate and YBa2Cu 3O7-x film indicating c-axis growth. Transmission electron microscopy on planar and cross-sectional samples revealed a single domain film. The c-axis orientation in the lead titanate film is ascribed to the good lattice match of the a-axis of lead titanate with the a- or b-axes of the YBa2Cu3O7-x film. A cubic lead titanate film is deposited above the Curie point. Compressive stresses arise in the lead titanate film due to lattice mismatch. The c-axis orientation is favored since it reduces the compressive residual stresses.},
  year = {1993},
  journal = {Applied Physics Letters},
  volume = {62},
  number = {15},
  pages = {1742-1744},
  issn = {00036951},
  doi = {10.1063/1.109592},
  note = {cited By 23},
  language = {eng},
}