@article{33932,
  keywords = {Models, Thin films, Light transmission, Hysteresis, Lead compounds, Capacitors, Ultraviolet radiation, Electron transitions, Light polarization, Radiation effects, Fatigue of materials, Charge carriers, Fatigue testing, Helium cadmium lasers, Lead zirconate titanate thin film capacitors, Photocarriers, Polarization screening model, Remanent polarization},
  author = {J Lee and S Esayan and A Safari and Ramamoorthy Ramesh},
  title = {Effect of ultraviolet light on fatigue of lead zirconate titanate thin-film capacitors},
  abstract = {Fatigue of Pb(Zr0.52Ti0.48)O3 (PZT) thin-film capacitors was studied under UV light (He-Cd laser, λ=325 nm). The remanent polarization of the PZT film capacitors increased upon light illumination. Fatigue resistance was also improved under UV light. During fatigue test, the change in polarization of PZT films upon UV light illumination increased gradually with cycling. These results were examined within the framework of the polarization screening model, which is suggested as an essential process for fatigue. This leads to a conclusion that more charged defects are involved in the fatigue process through internal screening of polarization.},
  year = {1994},
  journal = {Applied Physics Letters},
  volume = {65},
  number = {2},
  pages = {254-256},
  issn = {00036951},
  doi = {10.1063/1.112617},
  note = {cited By 48},
  language = {eng},
}