@inproceedings{33748,
  keywords = {deposition, pulsed laser deposition, annealing, hysteresis, etching, oxygen, lanthanum compounds, Ferroelectric devices, Lead compounds, Capacitors, Crystal defects, Hysteresis loops, Pulsed laser applications, Partial pressure, Positrons, Oxygen deficient atmosphere, Positron depth profiling, Post growth annealing},
  author = {T Friessnegg and B Nielsen and V.J Ghosh and S Aggarwal and D.J Keeble and E.H Poindexter and Ramamoorthy Ramesh},
  title = {Oxygen deficiency and vacancy formation in LSCO/PLZT/LSCO capacitors},
  abstract = {Vacancy type defects in La0.5Sr0.5CoO3/Pb0.9La0.1Zr0.2 Ti0.8/La0.5Sr0.5CoO3 capacitors were investigated by positron depth profiling. Post-growth annealing of the capacitor structure in oxygen deficient atmosphere exhibits the formation of vacancy type defects in all layers. A significant increase in open volume defects was found in the top and bottom electrode. The changes in the bottom electrode were studied more closely by etching off the top layer.},
  year = {2000},
  journal = {Materials Research Society Symposium - Proceedings},
  volume = {596},
  pages = {393-397},
  publisher = {Materials Research Society, Warrendale, PA, United States},
  issn = {02729172},
  note = {cited By 2},
  language = {eng},
}