@article{33733,
  keywords = {Thin films, Pulsed laser deposition, Annealing, Anisotropy, Surface roughness, Film growth, X-ray Diffraction, Dislocations (crystals), Strain, Ferromagnetic resonance, Barium compounds, Rutherford backscattering spectroscopy, Metallic films, Magnetocrystalline energy, Magnetoelasticity},
  author = {L.V Saraf and S.E Lofland and A.V Cresce and S.M Bhagat and Ramamoorthy Ramesh},
  title = {Structural and ferromagnetic resonance characteristics of BaFe12O19 films with minimal linewidths},
  abstract = {Ferromagnetic resonance (FMR) and structural characteristics of BaFe12O19 films with minimal linewidths were discussed. These films were deposited on (0001) oriented alumina using optimized growth, annealing conditions, and pulsed laser deposition. Measurement of x-ray diffraction, Rutherford backscattering, magnetization, atomic force microscopy and FMR at 58 GHz was done for characterization of the films. It was shown that the intrinsic high frequency losses can be attained in these adequately annealed films, deposited on alumina by pulsed laser deposition.},
  year = {2001},
  journal = {Applied Physics Letters},
  volume = {79},
  number = {3},
  pages = {385-387},
  issn = {00036951},
  doi = {10.1063/1.1385348},
  note = {cited By 14},
  language = {eng},
}