@article{33678,
  keywords = {Atomic force microscopy, Epitaxial growth, Piezoelectricity, Ferroelectric thin films, Electric conductivity, Piezoresponse force microscopy (PFM), Relaxation processes, Epitaxial ferroelectric thin films},
  author = {L Chen and J Ouyang and C.S Ganpule and V Nagarajan and Ramamoorthy Ramesh and A.L Roytburd},
  title = {Formation of 90° elastic domains during local 180° switching in epitaxial ferroelectric thin films},
  abstract = {A cylindrical 180° domain was stabilized by the formation of 90° domains to relax stress that arises due to the opposite signs of the converse piezoelectric effects in the switched 180° domain and the unswitched film surrounding. It was found that the formation of 90° domains can be effective mechanism for the piezostress relaxation in 180° domains and their stabilization.},
  year = {2004},
  journal = {Applied Physics Letters},
  volume = {84},
  number = {2},
  pages = {254-256},
  issn = {00036951},
  doi = {10.1063/1.1633970},
  note = {cited By 41},
  language = {eng},
}