@article{33666,
  keywords = {Single crystals, piezoelectricity, Ferroelectric thin films, Electric field effects, Metallorganic chemical vapor deposition, Piezoelectric constants, Vectors, Elastic moduli, Full width at half maximum (FWHM), Piezoresponse microscopy, Substrate-clamped films, Lithography, Matrix algebra},
  author = {J Ouyang and S.Y Yang and L Chen and Ramamoorthy Ramesh and A.L Roytburd},
  title = {Orientation dependence of the converse piezoelectric constants for epitaxial single domain ferroelectric films},
  abstract = {The general expressions for the effective piezoelectric constants for substrate-clamped films as function of film orientation were discussed. The piezoelectric constants of films with a tetragonal crystallographic structure were calculated for typical orientations. The piezoelectric constants were measured experimentally for single domain ferroelectric Pb(Zr 0.2Ti 0.8)O 3 thin films. The theoretical results were found to be in good agreement with the experimental observations.},
  year = {2004},
  journal = {Applied Physics Letters},
  volume = {85},
  number = {2},
  pages = {278-280},
  issn = {00036951},
  doi = {10.1063/1.1771463},
  note = {cited By 32},
  language = {eng},
}