@article{33666, keywords = {Single crystals, Piezoelectricity, Ferroelectric thin films, Electric field effects, Metallorganic chemical vapor deposition, Piezoelectric constants, Vectors, Elastic moduli, Full width at half maximum (FWHM), Piezoresponse microscopy, Substrate-clamped films, Lithography, Matrix algebra}, author = {J Ouyang and S.Y Yang and L Chen and Ramamoorthy Ramesh and A.L Roytburd}, title = {Orientation dependence of the converse piezoelectric constants for epitaxial single domain ferroelectric films}, abstract = {The general expressions for the effective piezoelectric constants for substrate-clamped films as function of film orientation were discussed. The piezoelectric constants of films with a tetragonal crystallographic structure were calculated for typical orientations. The piezoelectric constants were measured experimentally for single domain ferroelectric Pb(Zr 0.2Ti 0.8)O 3 thin films. The theoretical results were found to be in good agreement with the experimental observations.}, year = {2004}, journal = {Applied Physics Letters}, volume = {85}, number = {2}, pages = {278-280}, issn = {00036951}, doi = {10.1063/1.1771463}, note = {cited By 32}, language = {eng}, }