@article{33647,
  keywords = {Chemical analysis, Nanostructured materials, Atomic force microscopy, Ferroelectric materials, Epitaxial growth, Bismuth compounds, Magnetization, Piezoelectricity, Electric field effects, Piezoelectric force microscopy (PEM), Elastic coupling, Magnetic force microscopy (MFM), Magnetization switching, Switching circuits},
  author = {F Zavaliche and H Zheng and L Mohaddes-Ardabili and S.Y Yang and Q Zhan and P Shafer and E Reilly and R Chopdekar and Y Jia and P Wright and D.G Schlom and Y Suzuki and Ramamoorthy Ramesh},
  title = {Electric field-induced magnetization switching in epitaxial columnar nanostructures},
  abstract = {We present direct evidence for room-temperature magnetization reversal induced by an electric field in epitaxial ferroelectric BiFeO 3-ferrimagnetic CoFe 2O 4 columnar nanostructures. Piezoelectric force microscopy and magnetic force microscopy were used to locally image the coupled piezoelectric-magnetic switching. Quantitative analyses give a perpendicular magnetoelectric susceptibility of ∼1.0 × 10 -2 G cm/V. The observed effect is due to the strong elastic coupling between the two ferroic constituents as the result of the three-dimensional heteroepitaxy. © 2005 American Chemical Society.},
  year = {2005},
  journal = {Nano Letters},
  volume = {5},
  number = {9},
  pages = {1793-1796},
  issn = {15306984},
  doi = {10.1021/nl051406i},
  note = {cited By 352},
  language = {eng},
}